Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionization time-of-flight mass spectrometry > 논문현황

Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionizatio…

논문명	Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionization time-of-flight mass spectrometry
연도	2018
저널명	Talanta
게재년월	2018.05.
게재 권/집	182
쪽수	273-278
저자	Kookjoo Kim, Kiju Um, Cheolsang Yoon, Won Sun Ryoo, Kangtaek Lee*