메뉴 바로가기

본문으로 바로가기

논문

Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionizatio…


본문

논문명 Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionization time-of-flight mass spectrometry
연도 2018
저널명 Talanta
게재년월 2018.05.
게재 권/집 182
쪽수 273-278
저자 Kookjoo Kim, Kiju Um, Cheolsang Yoon, Won Sun Ryoo, Kangtaek Lee*